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From integrated materials engineering of microelectronics components and deformation in advanced alloys and composites to pore transport and ionic mobility in lithium-ion batteries or other energy materials, many problems in materials science can only be fully understood in 3D. The main thrust of materials science is to connect macroscale material properties with specific micro- and nanoscale structures. In this light, it has long been the goal of materials researchers across a wide range of application areas to identify and analyze critical nanoscale features buried deep within bulk samples.

Locating and imaging these nanoscale “needles in haystacks” requires microscopy techniques that provide critical insights into how representative the chosen sample site is compared to the bulk, enabling intentional and reliable nanoscale 3D investigations across sample types. They should offer deeper levels of understanding to accelerate the development of new materials in areas like nanomaterials, electronics research, next generation energy materials and advanced metallurgy.

This webcast will describe how exciting innovations in 3D X-ray, LaserFIB and AI-driven microscopy can advance your materials research studies. Integrating a femtosecond laser with FIB-SEM (LaserFIB) provides powerful, precise sample preparation. Correlative X-ray microscopy enables intentional sample site selection for representativeness of the chosen site. Coupling Deep Learning algorithms with X-ray microscopy enhances XRM image quality all-round, keeping the context of the field of view and achieving higher resolution for the details while offering improved automation, precision, repeatability, and speed, letting you work in minutes rather than hours.

Learn how to:

• Use a unique correlative LaserFIB workflow to identify, access, prepare and analyze your needle in the haystack.
• Correlate multiple scales and modalities, perform X-ray guided site selection and get insights into representativeness of the chosen sample site.
• Perform analyses with the imaging or analytical capabilities of the fs laser powered FIB-SEM (LaserFIB) or prepare samples for further analysis using techniques such as nanoCT.

This webcast has been produced by Carl Zeiss Microscopy GmbH who retain sole responsibility for content. About this content