易于使用的X射线技术

简约新高度

一次扫描检查隐藏结构

ZEISS METROTOM 1

借助易于使用的ZEISS METROTOM 1的CT技术,只需一次扫描,任何人都能有效完成复杂的测量和检查任务。测量并检测接触式或光学测量系统无法检测到的隐藏缺陷和内部结构。另一个巧妙之处在于ZEISS METROTOM 1的尺寸。由于体积小,CT扫描系统很容易便能放置于您的测量实验室之中,可以一次性完成内部测量和检查。

一个CT系统,兼具多种优势

ZEISS METROTOM 1使用工业计算机断层扫描技术,是升级您的质量检查产品组合的理想设备。CT系统拥有许多优势:

操作简便

X-Ray easy-to-use

ZEISS METROTOM 1是以用户为基础建造的。安装过程简单,只需进行少量培训就能使用CT。只需轻轻一点,即可开始扫描流程!

精准的测量

Precise X-Ray Technology

小而彻底:您可以使用ZEISS Metrotom 1测量并评估完整的零件。这样,您可以信赖您的测量,进行准确的数模比对、尺寸检查和壁厚分析。

占地面积小

Compact CT system

蔡司METROTOM 1非常紧凑。尺寸为1750 mm(长) x 1820 mm(高) x 870 mm(宽)。这意味着CT系统适合任何测量实验室——可以让您在公司内部进行测量和质量保证,而无需外部测量服务。

投资回报快

Fast return on investment

购置成本低,且得益于合宜的系统维护保养费用,您的设备持有将变得物超所值:ZEISS METROTOM 1的射线管无需维护保养。

ZEISS METROTOM 1——紧凑而可靠

先进的CT技术,用于所有测量实验室

蔡司是CT技术领域的专家,十多年以来,其METROTOM系列一直在提供可靠的CT系统。蔡司计算机断层扫描系统METROTOM 1现在为每个人都提供了可靠的X射线技术和无损质量保证。

ZEISS METROTOM 1
Flat panel detector

平板探测器可以探测到筛选样品的X射线。

Rotary table

在扫描过程中,转台是一个重要组件,可以采集零件的完整3D数据集。

X-ray tube

X射线是由X射线管生成的,并穿透样品。

测量完整组件、 确保零件无瑕疵

使用ZEISS METROTOM 1,您可以在您的测量实验室里轻松检测出工件的隐藏缺陷。无论是中型还是小型零件,是塑料还是轻金属材质 - 使用ZEISS METROTOM 1,您可以检查各种零件,如连接器、塑料盖、铝制零件等等。

GOM Volume Inspect

Comprehensive CT data analysis in 3D

ZEISS METROTOM 1 comes with the operation and inspection software GOM Volume Inspect. The software is suitable for beginners and combines all stages of the CT process from scan set-up and reconstruction to data evaluation and reporting. Geometries, shrinkage holes or internal structures and assembly situations can be evaluated precisely. Even small defects become visible thanks to individual sectional images and can be automatically evaluated using a wide range of criteria. With just one software, you can load volume data from several components into a project, perform a trend analysis, compare the captured 3D data with the CAD model and more.

ZEISS METROTOM 1 with GOM Volume Inspect
ZEISS METROTOM 1 with GOM Volume Inspect

ZEISS Automated Defect Detection (ZADD)

Artificial intelligence in computed tomography

The ZADD add-on in GOM Volume Inspect detects even small and fuzzy defects in components reliably, quickly and automatically, ZADD detects, localizes and classifies defects or anomalies while analyzing them in detail by reading CT-scans. The software add-on is applicable for castings, injection molded parts, batteries printed components and other applications.

体验系统如何运作

技术数据

使用蔡司,实现小而强大的功能

应用领域:
无损检测、一次扫描多个工件。

检查特点:
测量内部和外部结构、检查内部缺陷(如缩孔)。

X-ray source

160 kV

X-ray detector (pixels):

2.5 k (2,500 x 2,500)

Measuring volume

165 x 140 mm

Metrology specification (MPE SD)

5 µm +L/100

Dimensions

1750 mm (W) x 1820 mm (H) x 870 mm (D)

Weight

2100 kg

Software

GOM Volume Inspect (included)

Resolution

32,6 μm

High Resolution Mode

With the High Resolution (HR) mode you can decrease the voxel size of your ZEISS METROTOM 1 system from 65.3 μm to 32.6 μm to better identify defects and to ensure the functionality and quality of your parts.

  • Spot even smaller details and avoid unnoticed defects
  • Improved image quality
  • Easy switch between Standard and High Resolution mode

Features

ZEISS METROTOM 1
Standard

ZEISS METROTOM 1
High Resolution

Voxel size

65.3 μm

32.6 μm

Measuring volume

165 x 140 mm

80 x 80 mm

Pixel size

78 μm x 78 μm

39 μm x 39 μm

View more details and receive a sharper image with the High Resolution mode.

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