In situ materials testing in scanning electron microscopy (SEM) is an emerging trend among SEM applications. The method is widely used to link the microstructure of a material with its macroscopic mechanical properties, by measuring the dynamical response of a material under mechanical load, in real time. When combined with further analytical techniques, such as energy dispersive spectroscopy (EDS) and electron backscatter diffraction (EBSD), the response of the material’s microstructure can be related to its chemical composition and crystallographic orientations. Understanding the relationship of the microstructures and properties of a material is essential for developing novel materials. Nevertheless, performing an in situ experiment in the SEM is a demanding task, due to poor integrations of in situ and analytical accessories. In this webinar, join Dr. Fang Zhou, manager of the business sector at ZEISS, as he introduces a fully integrated in situ solution in a field emission scanning electron microscope (FESEM), and explores automated workflows that can be used to generate meaningful data with high levels of reproducibility and precision.

Join this webinar to learn about:

• Highlights and benefits of a unique, fully integrated in situ solution and the technology behind it
• How to overcome common challenges faced during in situ experiments
• How this method compares with conventional in situ integrations
• How to address challenging applications, including working with metals, alloys, additive manufacturing materials, and polymers

Certificate of attendance

All webinar participants can request a certificate of attendance, and a learning outcomes summary document for continuing education purposes.